A Diagnosis of high energy ions by CR-39 detectors utilizing back scattered particles

Fukuda, Yuji; Kanasaki, Masato; Sakaki, Hironao; Hori, Toshihiko*; Tampo, Motonobu; Kurashima, Satoshi; Kamiya, Tomihiro; Kondo, Kiminori; Yamauchi, Tomoya*

no journal, , 

Recently, CR-39 detectors have been widely used in the studies of laser-driven ion acceleration experiments. In such experiments, however, the energies of accelerated ions often exceed the detection threshold limit of the CR-39. Therefore, a simple method to detect only high energy ions in mixed radiation fields with rays, X-rays and high energy electrons is required. We have developed a new simple diagnosis method, namely a backscattering technique, for high energy ions by utilizing the combination of CR-39 detectors and plastic backscatterers. This technique can be a simple method to characterize high energy ion beams which energies are far beyond the detection threshold limit of CR-39.